Device R&D and process studies
Compare devices, layouts, processes or bias states under controlled cumulative ionizing-dose conditions.
中文Request a testACCURAD TID-X INSTRUMENTS
Bring semiconductor TID workflows into your own laboratory
AccuRad TID-X integrates X-ray irradiation, dosimetry, device bias, parameter measurement, software and delivery support for wafers, chips, power devices and electronic modules.
PRODUCT POSITION
More than an X-ray cabinet
Configuration starts with the device and data required, then defines irradiation, dosimetry, bias, measurement and facility conditions.
Reliability and quality verification
Bring dose steps, electrical or functional measurements, criteria and reporting into a repeatable internal workflow.
Shared test and research platforms
Support multiple device types and users through scalable fixtures, instruments and data workflows.
In-house laboratory capability
Coordinate equipment, methods, training and service from facility, protection and licensing boundaries.
SYSTEM ARCHITECTURE
Four coordinated modules
Final models, ranges, channels and performance claims are defined together with verifiable acceptance conditions in the technical agreement.
Irradiation and motion control
X-ray source, sample plane, positioning, shutter, control and the required safety interlocks.
Dosimetry and field mapping
Reference medium, detector, calibration, dose records and field-uniformity evaluation.
Sample, bias and measurement
Fixtures, bias channels, instrument interfaces, cabling and electrical measurement checkpoints.
Software, records and export
Test configuration, system state, dose, bias, measurements, logs and data export.
TEST WORKFLOW
From sample intake to data export
Connect sample information, test configuration, dose records, bias state, measurements and system logs in a repeatable, reviewable and extensible workflow.
Explore systems and laboratory integration
CONFIGURATION LOGIC
Answer six questions before selecting the system
A useful comparison goes beyond one dose-rate or power number: the sample, method, data and facility must work together.
What devices?
Wafers, bare die, packaged devices, board-level assemblies or electronic modules.
What decision?
Process comparison, device screening, reliability study, product verification or research.
What dose conditions?
Total dose, dose rate, steps, reference medium and field-uniformity expectations.
How does the DUT operate?
Static or dynamic bias, channel count, limits, timing and exception handling.
What must be measured?
Offline or in-situ parameters, instruments, sampling cadence, data volume and criteria.
What facility is available?
Space, shielding, licensing, power, ventilation, network, logistics and maintenance.
DELIVERY AND SUPPORT
From configuration to continuing operation
Installation is not the finish line. Methods, acceptance records, training, maintenance and later expansion determine whether the capability remains usable.
Application assessment
Define devices, samples, dose, bias, measurements, throughput and expected use.
Configuration and agreement
Confirm the system, dosimetry, fixtures, instruments, software, interfaces and acceptance method.
Build and site preparation
Coordinate manufacturing with facility, protection, licensing, utilities and installation readiness.
Installation, acceptance and training
Complete agreed functional and performance checks and introduce operating and application methods.
Continuing service and expansion
Support calibration, maintenance, refresher training, fixtures, software and application work.
Licensing and safety boundary X-ray systems avoid purchasing, transporting and replacing radioisotope sources. Production, sale and use still remain subject to applicable radiation-safety licensing, protection, monitoring and personnel-management requirements.
PROJECT INTAKE
Ready to evaluate a TID-X configuration?
Share a non-sensitive device range, sample size, target dose, bias, measurement needs and expected usage so we can assess application and facility boundaries.