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SEMICONDUCTOR RADIATION EFFECTS TESTING AND VERIFICATION

From device to system,verify reliability undercumulative ionizing dose

X-ray total ionizing dose testing, biased irradiation, parameter monitoring, data interpretation and engineering reports for wafers, chips, power devices and electronic modules.

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Contract testing first · response within four business hours · de-identify sensitive inquiries

AccuRad TID-X semiconductor X-ray TID system concept
Wafers, die and power semiconductor packages concept

System and sample concept visuals · final configuration is defined in controlled technical documents

Contract testingMove from test definition and sample preparation to data and report delivery.Explore testing TID instrumentsReview AccuRad TID-X systems, configuration and delivery support.Explore instruments Device verificationChoose a path for power devices, digital ICs, memory and sensors.Select an application Laboratory buildAssess equipment, dosimetry, fixtures, facilities and acceptance boundaries.Explore lab integration

TWO BUSINESS PATHS

Complete the verification—or build the capability in-house

Contract testing is the primary entry. AccuRad instruments and laboratory integration support teams that need continuing internal TID capability.

CONTRACT TESTING

From application question to an engineering report

All testing services
X-ray TID testingDefine target dose, dose rate, device state and measurement checkpoints as an executable plan.Explore service Biased irradiation and monitoringControl DUT mapping, bias, limits, measurement and exception handling.Explore service Data interpretation and reportsSeparate records, observations, engineering interpretation and next-step recommendations.Explore service Multiple devices and packagesDiscuss fixtures, bias and measurement interfaces for wafers, die, packaged devices and modules.Explore service
INSTRUMENTS AND LABORATORY BUILD

AccuRad TID-X systems

X-ray total ionizing dose systems integrating irradiation, dosimetry, device bias, parameter measurement, software and safety interlocks.

  • Application-led configuration
  • Coordinated instruments, fixtures and data
  • Installation, training, acceptance and service
AccuRad TID-X semiconductor X-ray TID system concept in a laboratory setting
Product concept visual · model and configuration are defined in controlled technical documents

DEVICES AND APPLICATIONS

Build the verification path around the device question

X-ray TID addresses cumulative ionizing effects. It does not reproduce a complete space-radiation environment or replace SEE, neutron displacement, proton or heavy-ion testing.

POWER DEVICESSiC, GaN and power devices

Threshold voltage, leakage, conduction behavior and the coupling of radiation pre-stress with later electrical stress.

Explore application DIGITAL ICsFPGA, ASIC and SoC

Functional, interface, timing and operating-state evaluation across controlled dose and bias conditions.

Explore application MEMORY & SENSORSMemory, image sensors and PMIC

Data retention, dark current, noise, output stability and parameter drift.

Explore application WAFERS & PROCESSWafers, die and process studies

Sample-plane, measurement and data-boundary definition for process research and reliability evaluation.

Explore application

TECHNICAL RESOURCES AND UPDATES

Engineering information—from test methods to device applications

Explore test variables, device response, instrument systems and service developments relevant to R&D and reliability decisions.

Wafer, power semiconductor device and total ionizing dose data concept
Power devices

Why TID pre-stress may change the short-circuit failure path of a SiC MOSFET

Identify the coupled engineering questions created by gate bias, threshold shift and short-circuit stress.

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TID dose and parameter-response concept
Test methods

Why bias conditions may change a TID conclusion at the same total dose

Turn DUT state, channels, actual values, duty cycle and checkpoints into controlled conditions.

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Wafer, die and packaged semiconductor concept
Materials

Neutron transmutation doping and X-ray TID answer different questions

Separate NTD material processing, neutron effects and cumulative ionizing-dose evaluation.

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Browse all resources

UPDATES

Technical progress, application insight and product updates

Browse all updates
Company newsAccuRad semiconductor radiation-effects testing and verification platform is now liveTechnical progressTID bias conditions: turn device state into a reproducible test variableApplication insightNeutron-irradiated silicon: routing NTD, neutron effects and X-ray TID

PROJECT ENQUIRY

Start with what you need to verify

Share a non-sensitive device category, objective, target dose, bias conditions and schedule. The appropriate testing, instrument or service specialist will follow up with you.

  1. SELECTTesting, instruments or laboratory integration
  2. SUBMITA de-identified outline and contact details
  3. RESPONSEA specialist contacts you within four business hours

Do not send classified models, mission names, customer-controlled documents or export-controlled information through the public form.

TEST REQUEST

Tell us what you need to verify

About 3 minutes · provide at least a phone number or email

Project outline
Contact details
Schedule and handoff
Request a testResponse within four business hours